We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Probe Microanalyzer.
ipros is IPROS GMS IPROS One of the largest technical database sites in Japan that collects information on.

Probe Microanalyzer - List of Manufacturers, Suppliers, Companies and Products

Probe Microanalyzer Product List

1~5 item / All 5 items

Displayed results

[Data] Example of EPMA Analysis

By using LIF and LIFH spectroscopic crystals, peak separation of 22Ti and 56Ba becomes possible!

EPMA has superior detection resolution compared to EDX. Even in cases where the detection positions of elements are close in EDX, making peak separation difficult, it may be possible to achieve peak separation with EPMA. This document introduces the peak separation of 22Ti and 56Ba. It includes analysis examples of multilayer ceramic capacitors and X-ray spectra of barium titanate (BaTiO3). [Contents] - Peak separation of 22Ti and 56Ba - Analysis example: Multilayer ceramic capacitors - X-ray spectrum of barium titanate (BaTiO3) *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

[EPMA] Electron Probe Micro Analyzer

By analyzing the characteristic X-rays generated when a finely focused electron beam is irradiated onto the surface of a solid sample in a vacuum, insights can be gained regarding the identification of elements and quantitative values.

By analyzing characteristic X-rays using a wavelength dispersive X-ray spectrometer (WDX), measurements with higher sensitivity than those obtained with an energy dispersive X-ray spectrometer (EDX) can be achieved. Additionally, using soft X-ray emission spectroscopy (SXES) allows for the acquisition of information regarding local chemical bonding states.

  • Contract measurement

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Electron Probe Microanalyzer (EPMA)

You can obtain more detailed measurement results than those obtained with the energy-dispersive detector (EDS) used in a scanning electron microscope (SEM).

Japan Electronics Co., Ltd. JXA-iSP100 Electron Probe Micro Analyzer (EPMA) enables observation of surface structure and morphology as well as localized trace element analysis. It is an integrated EPMA that has evolved further to perform operations from observation to analysis more efficiently. We are the world's only manufacturer capable of offering soft X-ray spectrometers. 〇Features - Auto-loading ensures secure loading of the holder! Quickly discover the area you want to observe! - Leave all the troublesome settings to the easy EPMA for immediate element analysis. - Efficient calibration with 18 types of built-in calibration samples. *For more details, please download the PDF or feel free to contact us.

  • Other physicochemical equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Example of EPMA analysis using the guide network map method.

Comprehensive analysis is possible! Here are examples of analysis using the EPMA guide network map method.

One of the features of EPMA is the guide network map method. In SEM-EDX, the measurement range is narrow, and for curved samples, surface analysis may not be accurately measured. However, by using the guide network map method of EPMA, extensive analysis becomes possible. This method automatically measures adjacent continuous areas and displays them collectively, making it useful for measuring surfaces with uneven height differences or for measuring large surfaces. 【Features of the Guide Network Map Method】 - A method for automatically measuring adjacent continuous areas and displaying them collectively. - Used for measuring surfaces with uneven height differences or for measuring large surfaces. *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Field Emission Electron Probe Microanalyzer

Anyone can use the device "easily" and "quickly."

Nihon Denshi Co., Ltd.'s Electron Probe Microanalyzer is an evolved integration EPMA that allows for more efficient operations from observation to analysis. * EPMA stands for Electron Probe Microanalyzer. 〇 Features - Auto-loading ensures the holder is securely loaded! Quickly discover the area you want to observe! - High-grade SEM images accessible to anyone thanks to comprehensive auto functions - Hassle-free settings with easy EPMA for immediate elemental analysis - Efficient calibration with 18 types of built-in calibration samples * For more details, please download the PDF or feel free to contact us.

  • Other physicochemical equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration